Focused Ion Beam / Scanning Electron Microscope: TESCAN S8000X
Eric A. Stach, Mark Allen, Marija Drndic and Deep Jariwala, University of Pennsylvania
06/01/2020
Eric A. Stach, Mark Allen, Marija Drndic and Deep Jariwala, University of Pennsylvania
06/01/2020
State-of-the-Art X-ray Scattering Instrument: Xeuss 2.0 from Xenocs
Karen I. Winey and Paul A. Heiney, University of Pennsylvania
06/01/2019
Karen I. Winey and Paul A. Heiney, University of Pennsylvania
06/01/2019